Tilted fluctuation electron microscopy
نویسندگان
چکیده
منابع مشابه
Simulation of Decoherence in Fluctuation Electron Microscopy
Fluctuation Electron Microscopy (FEM) examines the scattering statistics from small volumes of thin amorphous materials to detect the presence of medium-range order (MRO) [1]. By now it has been thoroughly demonstrated, by both modeling and simulations, that FEM is extraordinarily sensitive to MRO, much more than high-resolution diffraction and high-resolution imaging. Experiments have confirme...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2020
ISSN: 0003-6951,1077-3118
DOI: 10.1063/5.0015532